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  • PCIT: Phase Contrast Imaging and Tomography

  • PCIT: Phase Contrast Imaging and Tomography

    Contact: Dr. Krzysztof Banas (slskbnus.edu.sg)
  • PCIT beamline features a white beam of hard X-rays with a cross-section of 20×8 mm2 and an energy range of about 4 – 12 keV. From the source point, the beam travels through about 15 m of ultrahigh vacuum, then through a 500 µm thick Be window and about 1.7 m of air at normal conditions and a collimation set-up before impinging on the specimen. After passing through, the X-rays are converted to visible photons by a CdWO4 scintillator and deflected by a mirror into CoolSNAP HQ2 high-sensitivity CCD camera (Photometrics, a division of Roper Scientific, Inc.).

Phase Contrast Imaging and Tomography beamline at Singapore Synchrotron Light Source
PCIT setup Setup of PCIT beamline

  • Specification

  • Name Specification
    Techniques Phase Contrast Imaging (2D) and Tomography (3D) additionaly X-Ray Fluorescence Spectroscopy
    Energy range 4-12 keV white beam
    Distance source-sample aproximately 17 m
    Spatial resolution nominal 1 µm
    Maximum field of view 3 mm by 2 mm
    Motorised stage Kohzu goniometer with 10 axis of freedom including 4 tilts, 5 translations and 1 rotation 1 µm and 0.01° precision
    Conversion X-ray to visible photonsCdWO4 scintillator
    Detector CoolSNAP HQ2 CCD camera
    Microscope AZ100 Nikon Multizoom 1x – 8x
  • CCD Camera     
    Camera CoolSNAP HQ2
    Sensor Sony ICX285
    CCD type Interline-transfer
    CCD format 1392 x 1040
    Linear full well 16 ke-
    Pixel size 6.45 x 6.45 µm
    Imaging area 8.77 x 6.6 mm
    Readout speed, A/D 10/20 MHz 14/12 Bitcamera
    Max. frame rate 56 fpszoom 1x – 8x
    CCD Temp. -30 °C
    Dark current <0.001e-/p/s @-30 °C
    Interface FireWire / PCI
    Microscope AZ100 Nikon Multizoom 1x – 8x

  • Software


  • For data aquisition in manual and automatic mode:
    Image Pro Plus http://www.mediacy.com/index.aspx?page=IPP

    For data evaluation:
    X-TRACT http://www.ts-imaging.net/Services/AppInfo/X-TRACT.aspx Fully featured imaging suite specifically designed for X-ray phase contrast imaging. It contains tools for pre-processing of recorded data, as well as phase retrieval and cone beam computed tomography modules.

    For 3D rendering:
    AMIRA http://www.amira.com/ powerful, multifaceted software platform for visualizing, manipulating, and understanding data coming from all types of sources and modalities.

  • Projects

  • Selected research topics done at PCIT:

    • Imaging Cells and Tissues with Refractive Index Radiology
    • Noninvasive Observation of External and Internal Membrane Filtration Phenomena by X-ray Microimaging
    • Observation of flow characteristics in a hollow fiber lumen using non-invasive X-ray microimaging (XMI)
    • Quantitative investigation of phase retrieval from X-ray phase-contrast tomographic images
    • Volcanic rock samples internal structure evaluated by X-ray phase-contrast tomography

    Polyacrylonitrile capillary for water filtration, 3D reconstruction of fiber after filtration with visible deposit, Scaffold: polycaprolactone–tricalcium phosphate (PCL–TCP) polymer matrix with CaP particles, Microfabricated SU-8 test structure

    Potential Phase Contrast Imaging Applications:

    • polymer science and engineering,
    • life sciences,
    • bio- and biomedical engineering,
    • biology and zoology,
    • geology,
    • water treatment and filtration,
    • membrane science,
    • materials science...

  • X-ray Fluorescence

  • X-Ray Fluorescence (XRF) method is widely used to measure the elemental composition of materials. Atoms in the sample are excited and emit characteristic X-ray photons.

    Schematic of the X-ray Fluorescence experiment

    Experimental setup used for X-ray Fluorescence experiment

  •
    Detector Amptek XR 100 CR Si-PIN Photodiode
    Detector size 7 mm2
    Silicon thickness300 µm
    Energy Resolution215 eV FWHM @ 5.9 keV
    Background Counts<3 x 10-3/s, 2 keV to 150 keV for 7 mm2/300 µm detector
    Detector Be window thickness0.5 mil (12.5 µm)
    Power supply and amplifierAmptek PX2T/CR

    • XRF features:

    • instrumental analytical technique -multi-element capability,
    • elemental analysis of solids and liquids,
    • minimal sample treatment,
    • concentration range: ppm to %,
    • element range: from S to Se (K-lines) and from Mo to Bi (L-lines).

    XRF application areas:

    • materials research,
    • geology and geochemistry,
    • environmental analysis,
    • mining and exploration,
    • archaeology,
    • industrial process control (metallurgy, cement, glass, industry),
    • forensic science,
    • ...

    Element range