PCIT setup | Setup of PCIT beamline |
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Name | Specification |
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Techniques | Phase Contrast Imaging (2D) and Tomography (3D) additionaly X-Ray Fluorescence Spectroscopy |
Energy range | 4-12 keV white beam |
Distance source-sample | aproximately 17 m |
Spatial resolution | nominal 1 µm |
Maximum field of view | 3 mm by 2 mm |
Motorised stage | Kohzu goniometer with 10 axis of freedom including 4 tilts, 5 translations and 1 rotation 1 µm and 0.01° precision |
Conversion X-ray to visible photons | CdWO4 scintillator |
Detector | CoolSNAP HQ2 CCD camera |
Microscope | AZ100 Nikon Multizoom 1x – 8x |
CCD Camera | |
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Camera | CoolSNAP HQ2 |
Sensor | Sony ICX285 |
CCD type | Interline-transfer |
CCD format | 1392 x 1040 |
Linear full well | 16 ke- |
Pixel size | 6.45 x 6.45 µm |
Imaging area | 8.77 x 6.6 mm |
Readout speed, A/D | 10/20 MHz 14/12 Bitcamera |
Max. frame rate | 56 fpszoom 1x – 8x |
CCD Temp. | -30 °C |
Dark current | <0.001e-/p/s @-30 °C |
Interface | FireWire / PCI |
Microscope | AZ100 Nikon Multizoom 1x – 8x |
Selected research topics done at PCIT:
Polyacrylonitrile capillary for water filtration, 3D reconstruction of fiber after filtration with visible deposit, Scaffold: polycaprolactone–tricalcium phosphate (PCL–TCP) polymer matrix with CaP particles, Microfabricated SU-8 test structure
Potential Phase Contrast Imaging Applications:
X-Ray Fluorescence (XRF) method is widely used to measure the elemental composition of materials. Atoms in the sample are excited and emit characteristic X-ray photons.
Schematic of the X-ray Fluorescence experiment
Experimental setup used for X-ray Fluorescence experiment
Detector | Amptek XR 100 CR Si-PIN Photodiode |
Detector size | 7 mm2 |
Silicon thickness | 300 µm |
Energy Resolution | 215 eV FWHM @ 5.9 keV |
Background Counts | <3 x 10-3/s, 2 keV to 150 keV for 7 mm2/300 µm detector |
Detector Be window thickness | 0.5 mil (12.5 µm) |
Power supply and amplifier | Amptek PX2T/CR |
XRF features:
XRF application areas:
Element range