Beamline type | VUV and Soft X-ray beamline |
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Energy range | 50 – 1200 eV |
Monochromator | SGM, Including angle 174º |
Calculated flux (0.7 GeV, 300 mA) | > ~1010 photons/s (E/ΔE=1000) @500 eV |
Resolving power (E/ΔE) | > 103 (E/ΔE) @500eV, 100 µm slit widths |
Spot size at sample (H X V) | 1.5 x 0.2 mm2 (main chamber) 4 x 3 mm2 (XMCD chamber) (FWHM) |
Polarization Degree | Linear polarization>95%, circular polarization>80% |
Main chamber |
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Equipment | Techniques |
Angle-resolved photoemission with a Scienta R4000 electron analyzer | Angle-resolved photoemission, X-ray photoelectron Spectroscopy, X-ray absorption spectroscopy (XAS) in TEY (Total electron yield) and AEY (Auger electron yield) modes. |
LEED | Low energy electron diffraction |
Sputtering gun | Ar+ bombard clean sample |
XMCD chamber | |
Magnet (HTS-110) | Sweep from -2 T to +2T (Present ±1.2T ) |
Manipulator from SPECS | X-ray absorption spectroscopy (XAS) in TEY mode, X-ray Magnetic circular dichroism (XMCD) |
Temperature control | 78 K-330K (LN2), 10K-330K (LHe) |
Vacuum pressures | |
Main chamber (mbar) | 2x10-10 |
XMCD chamber (mbar) | 5x10-10 |
Samples should be UHV compatible solid materials, may be bulk or thin film, powder material should be compressed into thin flake.
Maximum sample size is 10x10 mm2; thickness usually is less than 3 mm. However, to use less size samples to mount more samples on a single plate, will reduce greatly the time to exchange the samples from load-lock chamber to both measurement chambers.
For XMCD measurement, due to big beam spot size, please use larger sample (8x5 mm2) and at most two samples on single plate.
For thin films growth on insulator substrate, a carbon tape is used to electrically short-cut sample surface with plate, prevent of sample charging.
XAS and XMCD measurements at Fe L-edges for multilayers with giant perpendicular magnetic anisotropy (PMA)[ Lourembam, J. , Yu, X. J., et al. (2020) Phys. Rev. Appl., 14, 054022–12.]
Work function, Surface coverage (ΨSAM), thickness of SAM (dSAM) of self-assembled monolayers (SAMs) determined by angle-dependent X-ray photoelectron spectroscopy [ X. Chen, B. Kretz, F. Adoah, C. Nickle, X. Chi, X. Yu, E. del Barco, D. Thompson, D.A. Egger, and C.A. Nijhuis, “A single atom change turns insulating saturated wires into molecular conductors,” Nat. Commun. 12, 3432 (2021).] .