Singapore Synchrotron Light Source

Makes Light Work For You

XDD : X-ray Development and Demonstration

Contact person: Dr. Yang Ping (slsyangpnus.edu.sg)
Contact person: Userdesk (slsuserdesknus.edu.sg)

Expertise:
• Diffractometry
• Reflectometry
• Diffuse Scattering
• Topography
• Fluorescence Analysis
• Absorption Spectroscopy


Spectrum range: (phs/s/mradH/500mA/0.1%BW)
Source parameters: σx=1.45 mm, σy=0.33 mm
  σx'=1.49 mrad, σy'=0.16 mrad



Attachments:
X-ray fluorescence detecting system: 
XR-100R Si diode detector and MCA8000A multi-channel analyzer, AMPTEK Inc. Energy resolution: 215 eV@5.9 keV.
Absorption spectrum measure system: 
ion-chambers attached to the diffractometer.Incident beam conditioner, analyser and mirrors will be added. 

Propopsed beamline optical parameters:
Optical element

Bent conical collimating-mirror*

Channel-cut-monochromator

Bent conical refocusing-mirror*

Pt coated

qc=0.466°@10 keV

rin=94.8 mm

rout=100.3 mm

rmeridional=1475.5 m

Si (111)

Pt coated, qc=0.466°@10 keV (reverse use of the 1st mirror)

rin=100.3 mm

rout=94.8 mm

rmeridional=1475.5 m

Photon energy

Up to 10 keV.

2.3-10 (13.74) keV. (mono) or white beam

2.3-10 keV.

Energy resolution

  

DE/E~2.0-73x10-4 on divergence

  

Beam size & flux

  

40x6.0 mm2 max. at mono;

49x9.0 mm2 max. at sample, (11x6 mm2, 5x109 phs/s@8 keV for 1 mrad, DE/E~2.2x10-3at sample), unfocused

3.1x.8 mm2 at sample, FWHM,

5.6x1010 phs/s@8 keV, focused

Distance

6 m from source

8.15 m from source (no mirror)

6 m to sample

Horizontal acceptance

10 mrad. on average

4.9 mrad.

10 mrad. on average

* Courtesy Prof Nomura Masaharu

Diffratometer schematic

Applications:

XDD beam line and its experimental station are designed for a general purpose of diffractometry, fluorescence detection and absorption spectroscopy, which will serve the research, characterization and process monitoring in universities, institutes and industry inSingapore and the region. Following applications will be devoted:

High-resolution diffraction: for precise structure parameter, minute strain status, composition, thickness, surface/interface roughness and texture/stress analysis;

Powder diffraction: for structure determination and refinement, phase identification in quality and quantity, lattice-parameter determination, crystal grain size & texture/stress analysis.

Grazing-incidence-diffraction, reflectometry and diffuse scattering: for surface and interface structure /ordering, surface phase identification/transition;

Fluorescence: for element analysis, x-ray standing wave;

Absorption spectroscopy: XAFS, L-edges of elements especially.

Besides, X-ray diffraction topography has been taken.


Diffractometer: Huber 4-circle system
Specifications of goniometer    
  Range

Precision (step-size)

 Repeatability

ω

0-360° (without accessory)

0.0001°

+/-0.0005°

2θ

0-360° (without accessory)

0.0001°

+/-0.0005°
χ

-3-+93°
(1/4 circle Eulerian cradle)

0.0001°

+/-0.001°

φ

0-360°

0.0005°

+/-0.0005°

X,Y table

0-150 mm

0.001 mm

+/-0.001 mm

Z-table

0-10 mm

0.001 mm

+/-0.001 mm


Demonstrations:










top